Organic semiconductor thin films deposited by resonant infrared matrix-assisted pulsed laser evaporation: A fundamental study of the emulsion target

TitleOrganic semiconductor thin films deposited by resonant infrared matrix-assisted pulsed laser evaporation: A fundamental study of the emulsion target
Publication TypeJournal Article
Year of Publication2015
AuthorsY Liu, A Atewologun, and AD Stiff-Roberts
JournalMaterials Research Society Symposium Proceedings
Volume1733
Start Page19
Pagination19 - 26
Date Published01/2015
Abstract

© 2015 Materials Research Society. Poly (3-hexylthiophene) (P3HT) thin films were deposited using emulsion-based, resonant infrared matrix-assisted pulsed laser evaporation (RIR-MAPLE) from emulsions containing different solvents and different alcohols, to investigate the impact of emulsion on film morphology. The atomic force microscopy (AFM) and grazing-incidence, wide angle x-ray scattering (GIW AXS) results show that surface morphology of RIR-MAPLE as-deposited films can be varied from rough to smooth and the microcrystalline domain orientations with respect to the substrate can be tuned from randomly oriented to preferentially oriented in the vertical direction. The demonstrated ability to tune the structural characteristics of polymer thin films by controlling the target emulsion is important for the application of organic optoelectronic devices deposited by RIR-MAPLE.

DOI10.1557/opl.2014.957
Short TitleMaterials Research Society Symposium Proceedings