|Title||Resonant infrared matrix-assisted pulsed laser evaporation of inorganic nanoparticles and organic/inorganic hybrid nanocomposites|
|Publication Type||Journal Article|
|Year of Publication||2010|
|Authors||Pate, R, Lantz, KR, Dhawan, A, Vo-Dinh, T, and Stiff-Roberts, AD|
|Journal||AIP Conference Proceedings|
|Pagination||812 - 823|
In this research, resonant infrared matrix-assisted pulsed laser evaporation (RIR-MAPLE) has been used to deposit different classes of inorganic nanoparticles, including bare, un-encapsulated ZnO and Au nanoparticles, as well as ligand-encapsulated CdSe colloidal quantum dots (CQDs). RIR-MAPLE has been used for thin-film deposition of different organic/inorganic hybrid nanocomposites using some of these inorganic nanoparticles, including CdSe CQD-poly[2-methoxy-5-(2'-ethylhexyloxy)-1,4-(1-cyanovinylene)phenylene] (MEH-CN-PPV) nanocomposites and Au nanoparticle-poly(methyl methacrylate) (PMMA) nanocomposites. The unique contribution of this research is that a technique is demonstrated for the deposition of organic-based thin-films requiring solvents with bond energies that do not have to be resonant with the laser energy. By creating an emulsion of solvent and ice in the target, RIR-MAPLE using a 2.94 μm laser can deposit most material systems because the hydroxyl bonds in the ice component of the emulsion matrix are strongly resonant with the 2.94 μm laser. In this way, the types of materials that can be deposited using RIR-MAPLE has been significantly expanded. Furthermore, materials with different solvent bond energies can be co-deposited without concern for material degradation and without the need to specifically tune the laser energy to each material solvent bond energy, thereby facilitating the realization of organic/inorganic hybrid nanocomposite thin-films. In addition to the structural characterization of the inorganic nanoparticle and hybrid nanocomposite thin-films deposited using this RIR-MAPLE technique, optical characterization is presented to demonstrate the potential of such films for optoelectronic device applications. © 2010 American Institute of Physics.
|Short Title||AIP Conference Proceedings|